XM DSSC- Brochure

Dye Sensitized Solar Cells Visible Spectrum - PhotoelectrochemistryDSSCPhotoelectrochemical Measurement SystemVisible Spectrum Semiconductor PhotocatalysisIntensity Modulated Photocurrent Spectroscopy (IMPS) Intensity Modulated Photovoltage Spectroscopy (IMVS)Impedance SpectroscopyI-VCharge Extraction MethodsShort CircuitDark Charge Extraction Photo Voltage Decayintroducing...Technique ParametersIMPS Effective Diffusion Coefficient of ElectronsIMVS Effective Lifetime of ElectronsPhoto Voltage Delay Effective Lifetime of ElectronsI-V Fill Factor, Pmax, Voc, Isc, EfficiencyCharge extraction - Dark Trapped Charge DensityCharge extraction - Short CircuitTrapped Charge DensitytheModuLab® XM DSSC is a fully integrated photoelectrochemical measurement system designed for the characterization of Dye Sensitized Solar Cells. Additionally, the system can be used for development of visible spectrum photoelectrochemical systems such as Iron- Oxide mediated photo-splitting of water. A comprehensive suite of techniques, developed by the leaders in this field for over 20 years are available. Solartron Analytical recognized that many users are unfamiliar to many of these techniques and therefore, at the heart of the product concept is the ability to analyze much of the data at one click of the mouse No previous knowledge of frequency domain technique required. For the experienced user, the ModuLab XM offers the ability to build and develop new experiment types with the powerful step sequencer. The highlights of the system Range of Frequency and Time Domain Measurements techniques including IMPS, IMVS, Impedance, PhotoVoltage Decay, Charge Extraction Techniques , I-V ‘Auto’ analysis of data enabled for calculation of effective Diffusion coefficients and Electron Lifetimes at one click of a button. Suitable for users new to Frequency Domain TechniquesNIST traceable Light Source calibration routineExcellent thermal management of light sources for long term stabilityWide range of Monochromatic high brightness LED’s availableFull suite of Electrochemical Techniques including Cyclic Voltammetry, Chrono - Methods, Galvano methods and comprehensive list of Impedance and AC Voltammetry MethodsAuxiliary Channel Measurements for simultaneous determination of anode and cathode impedance and voltagesSolartron Analytical FRA technology inside including single, swept and Multi-sine techniquesComprehensive Techniques PackageA dedicated suite of software specifically developed for testing photo-electrochemical devices is included:Enhanced ProductivityWith the ability to auto-sequence techniques, the full suite of measurement possibilities can be run at a click of the mouse. Unlike other systems, the ModuLab XM DSSC was designed to allow all measurements to be run in sequence without any interference from the end user. This greatly increases productivity and ease of use. Auto - AnalysisData can be auto-analyzed with pre-programed algorithms. Data is presented in graphical format allowing researchers to quickly evaluate their samples and provide in-depth information that is unavailable with simple I-V curve analysis alone.Detailed Analysis of DSSC’s Has Never Been EasierAuto Analysis of IMPSOther TechniquesThe system is delivered with 4 AUX voltage measurement channels. These channels are included specifically to enable the measurement of the internal quasi Fermi level of the DSSC.The system can also be configured to work with third party systems such as solar simulators and monochromators to extend measurement possibilities to:Full Sun I-V simulationsIPCE measurementsDSSCThe ModuLab XM DSSC utilizes the powerful ModuLab XM Frequency Response Analyzer and Potentiostat technology. Existing systems can be upgraded to ModuLab XM DSSC with an option card and optical bench.A comprehensive suite of standard electrochemical techniques is included:Data Export to Third Party AnalysisImpedance data can be easily exported to third party EIS analysis packages such as ZView™. A comprehensive list of pre-defined elements are available including Bisquert elements for the analysis of the Impedance response of DSSC’sSimulation and Fitting of EIS data in ZView™Optical BenchAt the heart of the ModuLab XM DSSC is a collimated and highly focused, high power light source. Key features of this bench include:NIST Traceable Calibration of Light SourcesHigh Light Intensity Measurements Excellent Thermal StabilityControl and Measure up to 6 decades of Light IntensityCollimation and Focusing OpticsReference Detection Technique up to 100 kHz for Solid State DevicesNIST Traceable Results PackagesEach optical bench is equipped with a 10 MHz, fast Si Photodetector. The NIST traceable sensor inside each detector is supplied with an individual factory calibration file. End users can refer all measurements in units of power per unit area in confidence of the accuracy and repeatability of results. Excellent Thermal StabilityThe new ModuLab XM DSSC incorporates high stability, high power LED’s which offer excellent thermal stability while eliminating the need for feedback control loops.Other systems might experience poor temperature management of the LED’s that can lead to significant output drift during the course of experiments and therefore may invalidate the results. Under such circumstances the system may have a limited range of output power or require additional, expensive feedback control electronics to regulate the output of the light source.Control and Measure up to 6 Decades ofThe fast Si Photodetector has seven gain stages which provide excellent measurement resolution for very low level intensity studies. The addition of a 0.01 Neutral Density filter extends the range of the measurement possibilities to over 6 decades of intensity. A two stage collimation and focusing optical arrangement ensures high power beams with > 0.1 Sun equivalent intensity and excellent homogeneity. This impressive performance is achieved without having to alter the optical arrangement thus ensuring repeatability of measurements.Reference Detection to Eliminate Phase andThe reference mode for transfer function techniques for photoelectrochemical systems such as IMPS and IMVS was first developed by Prof Laurie Peter in the late 1980’s. The ModuLab XM DSSC bench incorporates this philosophy with the addition of a reference mode. A 50:50 Anti-Reflective Coated beam splitter directs an equal amount of light onto the sample and the reference detector. The response of the cell under test is directly compared with the response of the reference signal thus eliminating errors associated phase shift and changes in magnitude of light. Magnitude Errors at High Drive FrequenciesNot Just a PhotoElectrochemical SystemCyclic Voltammetry (Staircase and Linear Sweep)Potentiostatic StepsNormal and Differential Pulse TechniquesPotentiostatic and Galvanostatic Impedance (Single Sine or Multi-Sine FFT)AC VoltammetryThe ability to control the optical bench for each of these techniques will allow researcher to develop more diagnostic techniques for DSSC’sFor more details about the ModuLab XM Potentiostat and FRA technology please review the ModuLab XM brochure.Light IntensityOther TechniquesSpecificationsPotentiostatSlots Taken 1Cell Connections 2, 3 or 4 terminalInstrument Connections CE, WE, RE, LoFloating Measurements yesImpedance Measurement Bandwidth 1 MHz (via FRA)Maximum ADC sample rate 1 MS/sSmooth Scan Generator 64 MS/s interpolated and filteredMaximum Time Record UnlimitedDC Scan Rate (potentiostatic) 1.6 MV/s to 1 µV/sDC Scan Rate (galvanostatic) 60 kA/s to 200 µA/sMinimum Pulse Duration 1 µsIR compensation yesCounter ElectrodeVoltage Polarization Range ±8 V (±100 V)*Current Polarization Range ±300 mA (± 2 A)*Maximum Compliance (Ce. vs Lo) ±8 VBandwidth (decade steps) 1 MHz to 10 HzPolarization V / I error (setting and range) 0.1% + 0.1%Slew Rate >10 V / µsReference Inputs (RE)Connections Differential InputCable Shields Driven / GroundMaximum Voltage Measurements ± 8 VRanges 8 V to 3 mVAccuracy (reading % + range% + offset) 0.1% + 0.05% + 100 µVMaximum Resolution 1 µVInput Impedance >100 G?, < 28 pFInput Bias Current <10 pAWorking Electrode (WE)Maximum Current ±300 mA Ranges 300 mA to 30 nAAccuracy (reading % +range % + offset) 0.1% + 0.05% + 30 fAMaximum Resolution 1.5 pACompliance Voltage Range (floating) ±8 VAuxiliary Electrodes (A, B, C, D)Connections 4 (each differential)Specification Same as RE aboveDC Measurement Synchronized to REImpedance Measurement Bandwidth 1 MHz (via FRA)LED OptionsLED Options (nm) Max Power (mA) Bandwidth (FWHM) (nm)420 500 12455 1000 18470 1600 29505 1000 30530 1600 31590 1600 14625 1000 16660 1200 25Cold White 1000 n/aWarm White 1000 n/aOpticsWavelength Range 400 nm-700 nmIntensity Range 6 decades (with ND filter)Max Beam Divergence 4°Max Beam Diameter / cell size 1 cm IMPS / IMVS Transfer Function Reference PhotodetectorCalibration NIST TraceableLED Driver Max Current 2 ATypical LED Stability at MAX power < 2% drift after 24hrsLED Driver Max Frequency (IMPS and IMVS)100kHzFrequency Response AnalyzerMaximum Sample Rate 40 MS/sFrequency Range (1 MHz and 300 kHz options)10 µHz to 1 MHz or 10 µHz to 300kHzFrequency Resolution 1 in 65,000,000Frequency Error ±100 ppmMinimum Integration Time per meas-urement (single sine, FFT or Harmonic)10 msSignal OutputWaveform Single Sine, MultisineSingle Sine Sweep Linear / LogarithmicMulti-Sine All Frequencies or Selected FrequenciesAnalysis ChannelsAccuracy (ratio) ± 0.1%, ± 0.1°Anti-alias and digital filters AutomaticAnalysis Channels RE, WE, Aux A/B/C/DAnalysis Modes Single Sine, FFT, HarmonicUSA801 South Illinois AvenueOak RidgeTN, 37831-0895 USATel: (865) 425-1289Fax: (865) 481-2410EuropeUnit 1 Armstrong MallSouthwood Business ParkFarnboroughHampshire GU14 ONR UKTel: +44 (0) 1252 556800Fax: +44 (0) 1252 556899Visit our website for a complete list of our global offices and authorized agentssolartron.info@ametek.com www.solartronanalytical.com0714B* not compatible with Photoelectrochemical card