Infrared Microscopy | Environmental XPRT
Articles & Whitepapers
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Sampling Air-Suspended Particulate Contaminants from Disk Drives
Our MPS-3 Microanalysis Particle Samplers have helped many engineers collect samples from computer disk drives for microanalysis and solve contamination problems. The MPS-3 Microanalysis Particle Sampler is an invaluable tool for the engineer to collect air-suspended particle samples from a disk drive for analysis. It is especially designed to make it easy for conducting analysis using advanced ...
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New Membranes for Environmental, Pharma and Wider Applications
Summary: A new membrane that’s better for your application Choose Gold-coated polyester membranes for: Detecting and characterizing micro-plastics in environmental water samples. Particle ...
News
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O-PTIR co-inventor wins 2019 Lippincott Award
The 2019 Ellis R. Lippincott Award was presented to co-inventor of the Optical Photothermal IR (O-PTIR) technique that is the basis for the operation of the mIRage IR microscope. The award is given for “outstanding contributions in inventing ...
CD BioGlyco Launches Tara Gum Production Service
Thermo Scientific Nicolet RaptIR FTIR Microscope Quickly Collects and Analyzes High-Spatial Resolution Data with Agility and Acuity
Bruker Releases Most Advanced nanoIR3-s Broadband Spectroscopy System
Photothermal Spectroscopy Corp Announced Winner of R&D 100 Awards
Equipment & Solutions
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Showcase
Advanced Semiconductor Packaging – TSV Metrology
The FilmTek™ 2000M TSV advanced semiconductor packaging metrology system provides an unmatched combination of speed, accuracy, and precision for high-throughput measurements of resist thickness, through silicon vias (TSVs), Cu-pillars, bumps, redistribution layer (RDL) and other packaging processes. TSV etch depth and depth uniformity is critical to ensure high yield during TSV fabrication. ...
