X-Ray Optical Systems (XOS)

HDXRF Offers Many Advantages Over ICP Methods


Source: X-Ray Optical Systems (XOS)

HDXRF® technology is fast, precise, and easy to use. In addition, the technology offers a 1-mm analysis area that provides the ability to test small features for the presence of potentially toxic heavy metals, including lead. When it comes to analyzing glass materials for lead, HDXRF can offer many advantages over ICP methods. In 2013, the CPSC expanded upon its approval of HDXRF ASTM method F2853 for the quantification of lead in surface coatings to include quantification of lead in homogeneous substrates as well, including glass.

Click here to view our application note and learn more about the advantages of using HDXRF versus ICP when analyzing lead in glass.

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