Photonic Lattice - 2D Birefringence Measurement System
The 2D Birefringence Measurement System is designed to provide high-speed birefringence measurement of transparent materials, catering to the needs of residual stress evaluation in transparent parts and phase uniformity in transparent films. The system, including the PA/WPA series, adapts to various measurement situations with a range from microscopic to macroscopic, up to 50 cm. It boasts a high resolution of 5 million pixels, particularly targeting low phase differences within the range of 0 to 130 nm. The WPA series extends this capability to 3,500 nm by measuring across three waves, making it suitable for larger resin products. The PA/WPA-NIR series supports operations at an 850 nm wavelength, essential for materials like special resins used in LIDAR systems, through quality control enhancements. The system includes software for data analysis and real-time decision-making, making it an invaluable tool for applications in environments demanding high precision and throughput.
PA/WPA series systems provide high-speed birefringence measurement of transparent materials, such as transparent parts for residual stress evaluation, or transparent films for the evaluation of phase uniformity.
PA/WPA series
PA/WPA series systems provide high-speed birefringence measurement of transparent materials, such as transparent parts for residual stress evaluation, or transparent films for the evaluation of phase uniformity.
Ranging from microscopic to macroscopic (～50cm), the field of view adapts to any measurement situation, and there is a system for each size.
PA series measures birefringence and phase difference with a high resolution of 5 million pixels at high speed, for low phase difference with a measurement range of 0 to 130 nm.
Suitable for measurement of glassware and other low phase difference targets.
WPA series expands the measurement range of phase difference from 0 to 3,500 nm by measuring birefringence/phase difference distribution over three waves.
Suitable for measuring large transparent resin products.
PA/WPA-NIR series
Operating at 850nm wavelength, this system provides strong tools for process and quality control of pieces not transparent at visible wavelengths, such as special resins and chacolgenide, used for example in LIDAR and face recognition systems.
VR lens evaluation system VRG-100
Dedicated equipment for evaluating VR-related parts
【Main specifications】
・Operating wavelength：466nm、543nm、650nm（Customization available）
・Retardation measurement range：0～λ/2（QWP measurement available）
・Measurement of retardation and circular polarization degree (ellipticity) for each RGB color is possible.
・Samples containing polarizers, which could not be measured with the conventional WPA series, can also be measured.
・Real-time measurement of the relative angle between the polarizer and the QWP is possible.