AST - Model 300-PCI -Advanced Probe Card Inspection System
The AST-300-PCI system utilizes a larger format system platform capable of inspecting an entire 300mm probe card at wafer level or a fully assembled probe card that is in its final integration state. Since probe cards can vary in size, shape, and weight, AST can help you determine if an AST-300-PCI platform meets all your probe card designs or if an AST-500 platform is better suited for addressing your specific probe card requirements and design variations. This system platform can also be leveraged to address automated inspection at the wafer and/or sub-assembly level providing a solution to keep critical processes in control and meeting required quality metrics.
The AST-300 platform integrates advanced positioning capability providing the required performance to perform high speed image scanning of the entire probe card with the capability to store and analyze at full resolution. The ability to singulate specific areas of interest for defect detection further optimizes the performance and capability of the system.
AST’s ability to configure the imaging system support multiple magnification and resolution options add to the flexibility of the products that can be processed and inspected on the system. The ability to integrate multiple optical / imaging systems further enhances the ability to detect defects and meet specific quality metrics for the product being inspected.
The ScopeViewer software suite supports all controls, imaging, and application specific scripts that execute the automated functionality of the system including the ability to detect defects using both AI (machine learning) and other proprietary detection techniques. Data can be outputted through SECS GEM or other factory information systems enabling report generation, process control, and other factory, process, and product metrics to be tracked.
These systems can also be configured to utilize an off-line AST image server and review station(s) for select manufacturing processes.