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Angstrom - Model ADX-2700 -X-ray Powder Diffraction Instrument
ADX-2700 θ-θ Powder X-ray Diffraction Instrument(XRD) is multi-function X ray diffractometer with exceptional analysis speed, reliability and reproducibility. The ADX2700 XRD is a diffraction instrument designed for the challenges of modern materials research. ADX2700 X Ray Diffractometer can analyze powders, liquids, thin films, nanomaterials and many other different materials. The ADX2700 X-Ray Diffraction can be used for many different applications: Academic, Pharmaceuticals, Chemical & Petrochemical, Material Research, Thin Film Metrology, Nano technology, Food & Cosmetics, Forensics, Mining & Minerals, Metals, Plastics & Polymers, etc.The ADX2700 X-ray Diffraction(XRD) has function of both θ-θ (theta-theta) and θ-2θ (theta-2theta) X-ray Powder Diffraction.
- Computed tomography, High-resolution X-ray diffraction, High throughput screening, In-plane diffraction, Crystallite size and micro-strain analysis, Micro-diffraction, Non-ambient diffraction, Pair distribution function analysis, Phase identification, Phase quantification, Reflectivity analysis, Residual stress analysis, Crystallography, Texture analysis, Transmission, Thin film analysis.
- ADX-DWZ Combination of Eulerian cradle for stress and texture investigations, Thin film and Quantity Analysis attachment with control and analysis software with alignment-free feature.
- ADCX sample changer is compact and rugged.
- Integrated spinning improves particle statistics in polycrystalline sample measurements.
- Fully automatic alignment.
- Programmable.
General diffraction data processing: automatic peak search, manual peak search, integral intensity, separation of Kα1,α2, background remove, pattern smoothing and magnifying, mulriple plot, three-dimensional plot and simulation of X-Ray Diffraction(XRD) pattern.
- Qualitative Analysis: The data processing software of ADX2700 X-ray Diffraction(XRD) has the search and match function on the base of whole profile and diffraction angle. The whole profile matching procedure employs the designed mode to do the qualitative analysis by reducing the search range from major, minor, to micro phase without indicating the diffraction angle. The diffraction angle matching procedure is based on the peaks position and intensity and usually used for the qualitative analysis of the data with large angle error.
- Quantitative Analysis: After the phase composition is determined, the content of each phase could be calculated with the help of RIR or/and the Rietveld refinement (Quantitative Analysis without criterion)
- Plot and Export: The data processing software is operated within the Windows interface. The preparing exported pattern could be labeled, zoomed in, zoomed out and also copied and pasted.
- Phase identification, structure analysis, Thin film analysis, stress investigation, Texture analysis are all available.