Logo Environmental XPRT
Companies
Products
Services
Software
Training
Applications
Sign in
List your business
VIEW Micro Metrology
premium
About
Downloads
  2. Companies
  3. VIEW Micro Metrology
  4. Products
  5. VIEW Software Feature - Area ...

VIEW Software Feature - Area Multi-Focus (AMF) Technology for 3D Surface Measurement

SHARE
AMF™ is an advanced video analysis technique available on VIEW Micro Metrology Summit, Pinnacle, Benchmark, and Precis dimensional measurement systems. The feature uses the data collected from a normal video auto-focus step and turns it into a 3D image of a feature. In addition to 3D information, it provides height or depth measurement of multiple features of a single image. This technique can be used to measure flatness, roughness, height, and volume. It is faster than any scanning method requiring XY stage motion.
Most popular related searches
depth measurement
metrology
3D measurement
metrology system

AMF is yet another example of VIEW’s commitment to advancing technology for video metrology applications.

Systems need to combine accurate and repeatable measurement capabilities with high-performance auto-focus and flexible programmability.