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Nano-Observer - Atomic Force Microscope (AFM )
The Nano-Observer AFM microscope is a flexible and powerful AFM. Designed with the ultimate technologies, it combines performance and ease of use. The USB controller offers a real integrated lock-in for better measurement capability (phase detection, Piezo-Response Mode…). A low-noise laser and a pre-alignment system provide simplicity and high resolution on a compact AFM head. Its intuitive software simplifies all Atomic Force Microscope settings to allow quick and safe AFM acquisitions.
Compact and robust, the Nano-Observer Atomic Force Microscope fulfills the requirements for advanced users or beginners. It avoids laser alignment with the pre-positioned tip system. A top and side view of the tip/sample, combined with vertical motorized control, makes the pre-approach easy.
- Material characterization
- Polymer science
- Electrical characterization
- Semiconductor
- Soft sample
- Biology
- XY Scan range 100µm (tolerance +/- 10%)
- Z range 9µm ( tolerance +/- 10%)
- XY drive resolution 24 bit control - 0.06 Angströms
- Z drive resolution 24 bit control – 0.006 Angströms
- Z noise level Reduced coherence laser Wavelenght 658 nm – power < 1mW
- Color optical view system Top and side view
- 6 DAC Outputs 6 D/A Converters – 24 bit
- 8 ADC Inputs 8 A/D Converters – 16 bit
- Data points Up to 4096
- Integrated Lock-in (Oscillating mode & phase) Up to 6 MHz
- Interface USB 2.0
- Controller size - weight 8 cm x 20 cm x 26 cm - 2 kg
- Power AC 100 – 240 V 47-63 Hz
- Operating System Windows XP (SP3 & Framework.NET 3.5 SP1) or Windows 7 or 8