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Kratos - Model AXIS Supra+ -Automated Multi-Technique Imaging X-Ray Photoelectron Spectrometer
The latest generation spectrometer, the AXIS Supra+, combines market-leading spectroscopic and imaging capabilities with unrivalled automation to ensure high sample throughput and ease of use.
The AXIS Supra+ is set apart from any other spectrometer by complete automation through computer control of sample handling and instrument parameters. Unattended sample holder transfer and exchange during analysis is achieved through coordination of the Flexi-lock sample magazine and sample analysis chamber auto-stage.
ESCApe integrated acquisition and processing software allows the AXIS Supra+ to perform to its maximum capability and provides an easy interface with the spectrometer.
Watch the AXIS Supra+ in action
Our introductory video gives an overview of the capabilities of the AXIS Supra+. See data acquisition and sample holder exchange in action. Learn about some of the many applications of the AXIS Supra+.
The AXIS Supra+ combines a 165 mm mean radius hemispherical sector analyser (HSA) for spectroscopy mode with a patented spherical mirror analyser (SMA). This unique combination allows high energy and spatial resolution in both spectroscopic and imaging modes. AXIS technology for electron transfer from the sample to the analysers includes our patented magnetic immersion lens and electrostatic lens column. The patented electron only charge neutraliser is incorporated at the end of the lens column, directly above the sample.
The delay-line detector (DLD) is used for counting photoelectrons in both spectroscopy and imaging modes. It comprises a multi-channel plate (MCP) stack above a 2-dimensional delay-line winding, a pre-amp and fast counting electronics. The DLD has three operating modes; conventional scanned spectroscopy mode, unscanned snapshot spectroscopy and 2D, parallel imaging mode.
Automated 5-axis precision manipulator. The stage is fully integrated with the acquisition software, allowing unattended sample exchange. The sample stage can be equipped with the optional heat and cool accessory.Auto-stage
ESCApe acquisition and processing software is developed and maintained by Kratos’ software group. The software runs on Microsoft Windows and makes User interaction with the spectrometer as simple as possible. As we move towards data dependent acquisition, automated peak identification and subsequent narrow region acquisition and reporting has been realised.
The instrument control units are accommodated underneath the work desk. Discrete units are used to control the numerous components that comprise the instrument. Additional accessory control units are housed within the same enclosure. The instrument has a relatively compact footprint.
The AXIS Supra+ can be specified with a standard monatomic Ar+ source (Minibeam 4) or optional Gas Cluster Ion Source (GCIS, Minibeam 6). Both ion sources are fully integrated into the ESCApe software for ease of use, including automated gas handling. The two ion sources are both capable of operating in He+ ion mode for optional Ion Scattering Spectroscopy (ISS).
The AXIS Supra+ is equally suited to routine, high-throughput sample analysis or cutting-edge research.
Chemical state X-ray photoelectron spectroscopy and imaging provides valuable insights into the electronic structure of a material. Sputter depth profiling provides elemental depth distribution information through thin-film materials. The applications of XPS and associated surface analytical techniques are numerous. Below, we highlight a number of common application areas for XPS.
As well as application notes generated here at Kratos, there are numerous publications that demonstrate the many varied applications and data generated using the AXIS Supra+.