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Amptek - Beryllium Free X-Ray Windows Detector
FromAmptek - AMETEK
Amptek is announcing the introduction of Boron Carbide (B4C) windows for use with Amptek’s FAST SDD® and SiPIN detectors. The product offering is the result of a multi-year effort to provide end-users and OEM manufacturers with a high-performance window alternative to standard beryllium (Be) foils.
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- Comparable transmission efficiency to Be foils over a wide energy range, typical to hand-held and benchtop XRF applications
- Results from an instrument will not be greatly affected when switching from Beryllium to B4C windows.
- Can be used in most places where a beryllium window was previously used.
- Non-toxic material provides worry-free handling during installation and use
- Concerns over the potential health hazards of beryllium and exposure are not an issue with these windows.
- Less thickness variation as compared to typical Be foils
- The beryllium window forming process allows a fair amount of variation in window thickness. The tightly controlled semiconductor fabrication process on the B4C windows produces a much more consistent window thickness.
- OEM`s prefer this as they can expect similar transmission from detector to detector, even at lower energies.
- Allows for better modeling in quantitative calculations if the window thickness more closely matches the nominal values.
B4C windows have been designed to provide transmissions comparable to standard ? mil and ½ mil Be windows. The initial product release utilizes a uniform 3.5 µm thick B4C layer, self-supported, without the need for an underlying grid. An aluminum outer coating provides a grounded surface to help shield the detector from EMI.

