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Manufactured by:CSInstruments based inLes ULIS, FRANCE
Kelvin Force Microscopy (KFM) allows to measure the surface potential between an oscillating conductive tip and the surface. Surface potential measurement can be used to determine intrinsic properties like work function or bandgap. CSInstruments has developed an ultra-sensitive implementation of KFM named as High Definition-KFM (HD-KFM), which uses 2 lock-ins matched to the first two eigenmode ...
