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Metrosemi Environmental Equipment & Supplies

2 equipment items found
Metrosemi - Model FLX 2320S - Wafer Stress Laser Scanner

Metrosemi - Model FLX 2320S - Wafer Stress Laser Scanner

Manufactured by:Metrosemi   based inSanta Clara, CALIFORNIA (USA)
The FLX-2320-S determines stress by measuring the curvature change of pre- and post- film deposition. It can measure film stress from -65ºC to 500ºC at a heating rate up to 30ºC/min. Stress variation with temperature is able to be used to characterize film properties, such as moisture concentration, phase changes, thermal expansion, volume changes, and plastic deformations. Other ...
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Metrosemi - Model 3900 Series - Wafer Defect Inspection and Review Systems

Metrosemi - Model 3900 Series - Wafer Defect Inspection and Review Systems

Manufactured by:Metrosemi   based inSanta Clara, CALIFORNIA (USA)
In advance of SEMICON West, KLA-Tencor Corporation (NASDAQ: KLAC) was introduced advanced wafer defect inspection and review systems for leading-edge IC device manufacturing: the 3900 Series (previously referred to as Gen 5) . This system employ a range of innovative technologies to form a comprehensive wafer inspection solution that enables discovery and control of yield-critical defects at all ...
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