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Cellcia Environmental Equipment & Supplies
1 equipment items found
Manufactured by:Tokyo Electron Limited (TEL) based inTokyo, JAPAN
There are an increasing variety of test requirements in conjunction with diversified device design, device application, process node shrink and package design complexity. To reduce total test cost, especially in Memory applications, multi-site probe cards were introduces as a way of reducing test cost. This method found its limit when single wafer/one-touch-down probe card technology appeared. ...