Metrodefect Environmental Equipment & Supplies

1 equipment items found

MetroDefect - Model 301 - Wafer Defect Inspection System

Manufactured by:Metrosemi based inSanta Clara, CALIFORNIA (USA)

2D imaging technology provides fast, reliable inspection for defects down to one micron. Metrosemi's Truebump Technology combines multiple 3D metrology techniques to deliver 100% bump height. This new technology is the foundation of Metrosemi’s products designed to offer fast throughput, increased brightfield and darkfield sensitivity and solves site alignment challenges for large die. The ...

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