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Stil Environmental Equipment & Supplies
5 equipment items found
Manufactured by:STIL, Part of Marposs S.p.A. based inix-en-Provence, FRANCE
With 180 measuring points aligned along a line ranging from 1 to 12 millimeters, the new MPLS-DM version enables high-quality inspection with new capabilities, and working frequencies up to 2kHz in standard mode, and even 6kHz with a reduced sensor measuring ...
Manufactured by:Bopla Gehause Systeme GmbH based inBünde, GERMANY
Protection class: IP 20. Enclosure Material: Profiles: Al Mg Si 0.5, anodised. Covers: diecast aluminium. Front handles/flanges: diecast aluminium. Side panels, cover and side plates: passivated ...
Manufactured by:STIL, Part of Marposs S.p.A. based inix-en-Provence, FRANCE
ZENITH controller is the new reference for chromatic confocal controllers adapted to the industrial environment. Based on the Ethernet standard communication, ZENITH allows high precision measurements without contact and without risk of altering the parts. Its robustness, its ease of use and implementation are designed to operate 24/7 (24 hours a day, 7 days a week, 52 weeks a year). Among the ...
Manufactured by:STIL, Part of Marposs S.p.A. based inix-en-Provence, FRANCE
Vision systems have a dual role: to provide a good quality image of the sample surface at the desired magnification and to process the image in order to detect and analyze certain predefined features or textures. Although processing units are becoming more and more powerful, the main limitation of current vision systems is their very small depth of field (a few tens of µm or less, depending ...
Manufactured by:STIL, Part of Marposs S.p.A. based inix-en-Provence, FRANCE
Vision systems have a dual role: Provide a good quality image of the sample surface at the desired magnification. Process the image to detect and analyze certain predefined features or textures. Although processing units are becoming more and more powerful, the main limitation of current vision systems is their very shallow depth of field (a few tens of µm or less, depending on the ...