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Cohu - Model Diamondx DxV -Semiconductor Tester
The Diamondx DxV semiconductor tester by Cohu delivers a full automated test equipment (ATE) performance within a compact desktop PC footprint. This self-contained unit is equipped with a high-performance Linux controller that operates Cohu’s Unison test environment, ensuring seamless integration with a broad range of test technologies. Its ultra-compact, noise-efficient design, requiring no separate workstation or support cabinets, is ideal for both lab development and high-volume production. The system supports high throughput applications with its 5 configurable instrument slots and utilizes a PCI-Express bus for data transfer speeds up to 80 Gbps. With software tools for adaptive and multisite testing, energy-efficient air-cooled architecture, and a standalone build, it reduces floor impact and costs significantly. The DxV is part of the Diamondx family, allowing scalability and flexibility for testing various components in fields like automotive, consumer electronics, and power management.
Diamondx DxV™ semiconductor tester is a self-contained unit with an embedded high-performance Linux controller running Cohu’s Unison test environment and associated tools. The ‘single box’ design and low overall weight enables true zero footprint test floor impact when docked to probe or final test material handlers.
Changes the Rules of Design through Production Test
The Diamondx DxVsemiconductor test system provides full ATE performance in a desktop PC footprint. Fully integrated with workstation inside system, ultra-compact test system, with low ambient noise it is designed to be used in the engineering lab or office. Unlike traditional semiconductor tester solutions there is no mainframe, separate workstation or support cabinets needed. The Diamondx DxV is completely stand-alone, so it can be placed on a bench or desktop. It is ideal for lab development and high-volume production.
- Post silicon validation and evaluation
- Engineering samples or quality testing and analysis
- High throughput wafer and wafer-level chip scale packaging test applications
- Low lot sized samples or quality test and analysis
5 Instrument Slots
5 instrument slots configurable with a broad range of Diamondx proven test technologies including high speed and high density instruments.
High-Speed Bus
Extremely high-speed data bus based on PCI-Express industry standard configured for up to 80 Gbps bi-direction transfer between system CPU and test head.
Flexible and Scalable
Simple re-configuring of the system to cover a broad range of applications. Portability using castors or light-weight manipulator.
Single Box Design
Completely stand-alone, true zero footprint production set up, with no mainframe, separate workstation or support cabinets needed.
Unison Software
Operating system offering a complete suite of test software tools, including scan test, concurrent test, adaptive test, unit level traceability multisite setup.
Energy-Efficient
Air-cooled architecture and instruments, no heat exchange or plumbing. Small Footprint and low-power consumption.