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CRAIC Technologies - Model 2030XL PRO™ ...

CRAIC Technologies - Model 2030XL PRO™ -UV-VIS/NIR Microspectrophotometer

FromCRAIC Technologies, Inc.

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The innovative 2030XL PRO™ microspectrophotometer is designed to allow you to acquire spectra, images, and film thickness measurements of microscopic features of large scale samples. `XL` stands for `extra large` and these are the types of samples for which this instrument was built. Built to meet your needs, the bespoke 2030XL PRO™ incorporates the latest technological advances in optics, spectroscopy and software to deliver the superior performance with unparalleled speed and capabilities. The ease-of-use for which CRAIC instruments are known has even been improved, making this instrument the cutting edge of UV-visible-NIR microspectroscopy.

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The 2030XL PRO™ microspectrophotometer allows you to measure UV-visible-NIR range transmission, absorbance, reflectance, emission and fluorescence spectra of features smaller than a micron across. Yet, depending upon the instrument configuration, the size of the sample can essentially be unlimited. Now you can map color varations within pixels of the biggest flat panel displays, measure film thickness of 300 mm wafers with ease or measure the fluorescence of the largest artworks.

Raman microspectroscopy, high resolution UV microscopy and even NIR microscopy are also offered.

The 2030XL PRO™ microspectrophotometer is simple to use, the measurements are non-destructive and the spectral data is unmatched.

Microspot analysis of very large scale samples
Spectral Range: 200 to 2500 nm
UV-visible-NIR transmission microspectroscopy
UV-visible-NIR transmission imaging
UV-visible-NIR reflectance microspectroscopy
UV-visible-NIR reflectance imaging
UV-visible-NIR fluorescence microspectroscopy
UV-visible-NIR fluorescence micro-imaging
Raman microspectroscopy
Polarization microspectroscopy in the UV, visible and NIR regions.
Polarization microscale imaging in the UV, visible and NIR regions
Thin film thickness measurements
Colorimetry of microscopic samples.
Refractive index measurements with the rIQ™ package.
Featuring Lightblades™ technology
Manual or fully automated operation
Integrated TE cooled array detectors for low noise and long term stability
Precision temperature control of samples
Calibrated, variable measurement areas even smaller than a micron
Superior images both with eyepieces and digital imaging
Featured with Lambdafire™ spectroscopy and imaging control and analysis software. Lambdafire™ also includes touchscreen control.
Specialized software including statistical analysis, spectral databasing, image analysis and more
Easy to use and maintain
From the experts in microspectroscopy

Semiconductor Film Thickness
MEMS devices
Colorimetry of flat panel displays
Intensity mapping of flat panel displays
Spectra of Questioned Documents
or any other large scale samples...