Universal Test Platform
Universal instrument slot architecture supporting 5-slot for small devices to 40-slot enabling over 500 multisite test parallelism.
The Diamondx semiconductor tester is an air-cooled, universal platform designed for comprehensive testing across the entire signal chain, including power, RF, and microcontroller components. It offers a cost-efficient solution that minimizes platform overhead while achieving high throughput. Particularly effective in high pin count and multisite environments, Diamondx supports testing for wireless, mobility, system-on-chip (SOC), flat panel displays, power management, and microcontroller devices. The platform is equipped with around 7,500 pins and wide-ranging digital, analog, and RF instruments, allowing for extensive test parallelism, notably essential in IoT applications. Its RedDragon RF instrumentation suite extends testing capabilities to emerging 5G frequencies and standards like Wi-Fi 7 and Ultra-Wideband. Operating with a PCI-Express based data bus, Diamondx facilitates high-speed data transfer, supporting up to 80 Gbps. The platform's air-cooled, energy-efficient design and small footprint cater to varied industries including automotive, data centers, and industrial applications.
Diamondx semiconductor test system extends Cohu’s low-cost, high-throughput production test solution platforms to high pin count, higher site count wireless, mobility, SOC, Flat Panel Display drivers, Power Management, and microcontrollers. Designed to meet the cost drivers IC companies face, Diamondx extends Cohu’s leadership in lowering the cost of operations.
Proven capability in high-density digital, DC, analog instruments, as well as technology leading precision analog, SerDes, RF and Automotive test, makes the Diamondx test system suitable for today’s broad range of devices.
Diamondx’s universal test platform optimizes test parallelism for the entire Internet of Things (IoT) signal chain, including RF, power management and microcontroller devices. The RedDragon RF instrumentation suite for Diamondx enables testing of the expanding 5G frequencies, next generation Wi-Fi 7 and Ultra-Wideband (UWB) standards. Combined with high-density power management instruments, Diamondx delivers better throughput up to 480V testing capability in a flexible platform for IoT, high voltage data centers and electric vehicles.
Universal instrument slot architecture supporting 5-slot for small devices to 40-slot enabling over 500 multisite test parallelism.
Adaptable and scalable high-efficiency architecture to fit a range of multisite test strategies.
Extremely high-speed data bus based on PCI-Express industry standard configured for up to 80 Gbps bi-direction transfer between system CPU and test head.
Over 7,500 pins configured with a wide range of digital, analog, and RF instruments.
Operating system offering a complete suite of test software tools, including scan test, concurrent test, adaptive test, unit level traceability multisite setup.
Air-cooled architecture and instruments, no heat exchange or plumbing. Small Footprint and low-power consumption.