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  5. pv-tools - Model FPP-SCAN - Economical ...

pv-tools - Model FPP-SCAN -Economical Fpoint-probe Mapper for Routine Production Control

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This compact instrument is motorized in all axes to create mappings of sheet resistance and wafer resistivity with 100 points in less than 4 minutes. Single points can be re-measured after navigating the probe head to the desired location with a click on the map.

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DESIGN:

  • Can be combined with other measurements in same instrument (see TLM-SCAN++)
  • Easy-to-clean glass vacuum chuck
  • Measurement starts automatically when closing lid

PROBE HEADS:

  • Changed within seconds
  • Recognized by software
  • Tungsten carbide needles
  • Tip radius: 0.25 mm

SOFTWARE:

  • Mappings displayed with selectable color scheme and data labeling and functions like zoom, histogram, line-scans
  • Re-measure single points by clicking on images
  • Current-voltage-sweeps to test linearity
  • Auto numbering

Specifications

  • Duration for 10 x 10 map: 4 min.
  • Max. test current: 30 mA
  • Weight: 16 kg
  • L x W x H in cm: 36 x 48 x 24