FEI Magellan - Model XHR SEM -Electron Microscope

FEI`s Magellan XHR SEM, the newest family of scanning electron microscopes, allows scientists and engineers to quickly see things they could not see before. The Magellan creates a whole new Xtreme High Resolution SEM performance catergory. The Magellan gives unmatched resolution of 0.8nm across the whole range of accelerating voltages down to even 1kV. See 3D surface images at many different angles and at resolutions below one nanometer. Most importantly, the Magellan XHR SEM images samples at very low beam energies, avoiding distortions otherwise caused by the beam penetrating into the material below. Across the board, the Magellan Family extends the range of nanoscale imaging and analysis, with the speed and ease-of-use of traditional SEMs.