IXRF - Model SDD -Silicon Drift Detectors
IXRF’s range of electronically cooled (LN2 free) Silicon Drift Detectors (SDD) are optimized when coupled with our innovative Ethernet based 550i digital pulse processor. Specifically configured to each customer`s scanning electron microscope (SEM), IXRF`s SDD detectors provide exceptional and stable performance over a wide range of input count rates to produce rapid X-ray fluorescence elemental maps. The SDD detector is available in both EDS (SEM mounted with slide assembly) and XRF (various designs, no slide) formats. Choices of window materials are available, from Beryllium (8µm) to Thin Polymer (for light element x-ray transmission) and sensor active areas of 10mm² to 100mm² are offered. In addition, all or our SEM SDD versions are vibration free.
IXRF can update your SEM/EDS software and computer to the safety and security of the Windows 10 OS environment. Interoperability with Microsoft Office means generation of reports is simple and intuitive. And your SEM will be compliant with the latest corporate/institutional security protocols.
microXRF X-ray sources for Scanning Electron Microscopes (SEM): addition of an polycapillary X-ray tube and Iridium Ultra software will transform your SEM’s quantitative analytical capabilities. Higher peak to background ratios enable greater elemental sensitivity for higher Z elements: sensitivity exceeding e–-beam excitation by a factor of 10-1000X.