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LumisolarModel LSA -Professional (LSP) Inline Inspection System

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LSA automation and greateyes offer an advanced LumiSolarProfessional (LSP) inline inspection system for pre-laminates and solar modules. The tool is not only capable to detect micro cracks, low intensity cells and contaminations, it also determines misaligned bus bars, rotated solar cells and other quality issues fastly.

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The LSP Inline system exhibits a fast cycle time below 30sec including feed-in, inspection, automatic defect recognition, pass/fail decision and unloading. The unique design of the tool provide significant higher throughput and analysis power compared to conventional in-line EL inspection tools. Precise quality control, higher yield and cost savings are the main reason for implementing the machine in the production line. In contrast to other vendors the new inspection system uses two scientific greateyes cameras in combination with high-throughput objectives allowing for fast detection of the weak electroluminescence. Furthermore an innovative automatic image analysis software provides superior performance in the detection of failures within pre-laminates or solar modules.

  • Turn-key Inline EL Inspection System
  • Excellent image quality
  • Fast cycle time
  • automatic defect identification and classification
  • detection of misaligned cells and bus bars
  • System  Turn-key electroluminescence inline inspection system
  • Cell Type  mono- and polycrystalline silicon, thin-film, HIT, IBC
  • Complete cycle time  26sec (including feed-in, feed-out)
  • Max Size  2.0 x 1.0 m
  • Nominal throughput  138 modules/hour
  • Inspection  Sunny side down
  • Design flexibilities  Pre-laminate or module inspection | Inspection of mono- or poly-crystalline silicon, thin-film, HIT, IBC | Long-side or short-side forward feed-in / feed-out | Connectivity to supervisory systems (MES, ERP, QA)
  • System advantages  High nominal throughput, low total cycle time | Superior defect identification and classification compared to convential EL systems | Fixed imaging subsystem, no moving cameras | reduced maintainance & higher lifetime | Counting of branched cracks, total defect area, precise receipe control
  • Imaging Subsystem  Two scientific 16bit large format greateyes cameras, resolution 500μm
  • Defect detection  Cracks, inactive cell areas, Micro-cracks, contaminations, low intensity cells,
  • inactive (dead) cells, edge defects, misaligned bus bars, misaligned/rotated cells
  • Dimensions (W x D x H)  2200mm x 2200mm x 1400mm - for prelaminate inspection with long side forward
  • Certification  CE
  • Detection capabilities  Micro-cracks | Contaminations | Inactive areas | Low intensity/dead cells | Misaligned
  • Cells | Rotated cells | Edge defects
  • Characterization method  Forward bias electroluminescence inspection
  • No risk measurement - drive current below short-ciruit current
  • Scientific 16bit high dynamic range imaging subsystem