Model kSA 400 -Analytical Reflection High-Energy Electron Diffraction (Rheed) System
The kSA 400 analytical Reflection High-Energy Electron Diffraction (RHEED) system puts the power of RHEED at your fingertips. Whether analyzing a static diffraction pattern or acquiring data at multiple azimuths during substrate rotation, the kSA 400 makes quantitative RHEED analysis easy. Exploit the power of RHEED with the kSA 400!
The kSA 400 combines a high-resolution, high-speed, and high-sensitivity camera with sophisticated RHEED-specific acquisition and analysis software. This flexible system enables the analysis of virtually any image feature and, with one of many additional options, controls the electron gun for such tasks as acquiring RHEED rocking curves.
Easy to use and straightforward to install, the kSA 400 is designed for convenience and gives quantitative results right out of the box. Seamless integration between hardware and software as well as visually-driven RHEED pattern analysis, makes user operation straightforward and simple. Extensive customer input has helped us make the kSA 400 the industry’s most powerful analytical RHEED system and an integral part of MBE, PLD, PVD, and surface science chambers worldwide. Now in its fifth generation, the goal of the kSA 400 is to provide you with the most information from your RHEED pattern.
Growth Rate
The most common use of RHEED is for determining growth rate via RHEED intensity oscillations, a phenomena that occurs during layer-by-layer epitaxial growth. The kSA 400 determines growth rate via three complimentary methods: Fourier-transform, extrema count (derivative analysis), and damped sine wave fitting. These three techniques determine growth rate independently, resulting in very accurate and consistent measurement of your thin-film growth rate. Watch the kSA 400 monitor RHEED oscillations. For more detailed information see our Growth Rate Methods application note
Lattice Spacing/Strain
Another powerful use for RHEED is to determine the absolute atomic spacing, or lattice spacing, between atoms on a surface. The kSA 400 makes measuring absolute lattice spacing simple. Furthermore, if you’d like to measure the evolution of lattice spacing, or the strain of lattice mismatched growth, the kSA 400 makes this easy too. By monitoring the spacing between diffraction streaks using sophisticated, proven analysis algorithms, strain evolution with very high accuracy and resolution is at your fingertips with the kSA 400.
Structural Analysis
The kSA 400 makes analyzing surface structure easy. By acquiring RHEED images along the major crystal directions of the surface, measuring the pixel spacing and calculating a ratio, surface crystal structure can easily be determined. The kSA 400 also makes acquiring and archiving RHEED patterns a snap. The kSA 400 software contains a comprehensive RHEED Image Library (RIL) for reference and further analysis.
- High resolution, high S/N camera
- Optic Mounts for mounting to the RHEED screen viewport
- Appropriate cabling
- kSA 400 or kSA 400 Lite software for the Win10 operating system
- kSA 400 RHEED Image Library (full version of kSA 400 only)
- Computer (optional)
