MC2 Technologies

Model SMM -Calibration Kit

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Our kits enable a precise calibration of Scanning Microwave Microscopes. The device is made up various gold pads residing on silicon oxide steps with different heights, composed by 144 locus of 4 standards.

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Substrate information

  • Silicon (1-0-0) P type
  • Thickness: 325-375µm
  • Resistivity: 0.01-3 Ohm.cm