Photothermal Spectroscopy Corp.

PhotothermalModel O-PTIR -On-Contact, Submicron, Visible Probe Infrared Spectroscopy

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The use of O-PTIR submicron visible probe with no contact to detect the photothermal IR effect is the key breakthrough. It enables non-contact, submicron IR spectroscopy in reflection mode. This provides new analytical capabilities to analyze polymers, live single cells, particulates and more.

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O-PTIR submicron visible probe non-contact detection of the photothermal IR effect overcomes the key limitation of traditional FTIR/QCL microscopy. It does this by removing the fundamental spatial resolution limits of IR spectroscopy (10-20 microns). This limit is now governed by the visible beam wavelength. O-PTIR achieves submicron spatial resolution, all in non-contact, reflection mode operation.

Provides the best of both worlds by combining the convenience of O-PTIR submicron visible probe in non-contact reflection mode technique with “FTIR transmission-like” quality. The spectra are collected in reflection mode, where thickness, surface roughness or particle shape/size are not issues.

Three different O-PTIR spectra collected from 20 µm thick samples were searched against the KnowItAll® database. The results were high matches for polystyrene (PS) (left), polyethylene terephthalate (PET) (middle) and polymethyl methacrylate (PMMA) (right).