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Persee - Model XD-2 -X-ray Powder Diffractometer
The XD-2 X-ray powder diffractometer serves as an essential tool for analyzing and identifying the composition and structure of materials. Equipped with a vertical multifunction high-precision goniometer, it boasts a minimal step size of 0.00025° and mechanical repeatability of 0.0006°. This flexibility makes the θ-2θ goniometer suitable for both powdered and solid samples. The design facilitates user-friendly sample placement and maintenance, preserving the precision of the goniometer. Performance is robust, as evidenced by a standard deviation in diffraction angle of αSiO2 better than 0.0015°. Safety features include a cabinet design and goniometer shutter that prevent X-ray exposure unless specified configurations are securely set. With options to enhance system functionality, it adapts to diverse analytical needs, such as parallel light film annex, texture annex, and high-temperature annex. This diffractometer, utilizing X-ray penetrating capability, often finds applications in industrial non-destructive testing for detecting internal flaws in opaque objects.
X-ray powder diffractometer is the basic instrument on studying and indentifying the composition and structure of material.
- Vertical multifunction high precision goniometer: the minimal step size is 0.00025°. mechanical repeatability excels 0.0006°. θ-2θ goniometer could be selected, which is fit for normal powder and massive solid samples.
- Easy use and convenient maintenance: the sample is set horizontally because of the vertical goniometer. The sample is more conveniently put in. the sample stage is more conveniently cleaned up. The goniometer could not be polluted and the precision of goniometer is not influenced.
- High performance: the report of customer operating instrument for 8 months could be provided. The standard deviation of diffraction angle of αSiO2 is better than 0.0015°.
- Attention to the design of security mechanical: cabinets design and goniometer shutter using a chain institutions, has not yet specified the location of X-ray can not be opened, to prevent leakage of X-ray.
- A variety of option can extend system functionality: in accordance with the purpose of analysis, you can choose parallel light film annex, texture annex, high temperature annex, φ scanning and a variety of optional accessories.
The applied field is showed as follow:
- The atom arrangement of all kinds of compound in material could be determined. Some particular performance of material is related with atom arrangement.
- The composition of material could be determined.
- The ratio of all kinds compound could be determined.
- The grain size, stress, texture, orientation and crystallizability.