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Gamma Scientific - Model GS-191-FA-1045 -Rotary Reflectance Measurement System for Spectral & Colorimetric Analysis
The GS-191-FA-1045 Rotary Reflectance Measurement System by Gamma Scientific is a fully automated gonio-reflectance measurement instrument designed for high precision capture of spectral and colorimetric properties at 0° and 45° angles of incidence. It is optimized for analyzing coated glass, polished substrates, or diffuse surfaces without the need for second-surface masking. Capable of handling substrates as thin as 400µm, this system boasts a typical scan time of 300ms per measurement point. Utilizing high-precision spectroradiometric instrumentation and proprietary measurement techniques, the system delivers industry-leading accuracy, repeatability, and throughput for applications that require refractive index determination and thin-film coating thickness measurement. Operational specifications include a spectral range from 360 to 830 nm and a rapid measurement speed of less than 1500 ms. The integral BK-7 polished glass serves as a calibration reference standard. With dimensions of 1.75 meters in height, 1.6 meters in width, and 1.6 meters in depth, it supports multiple panel sizes and configurations, making it a versatile tool for rigorous optical assessments.
This fully automatic gonio-reflectance measurement system automatically captures complete spectral & colorimetric properties at 0° and 45° angle of incidence simultaneously, for coated glass, polished substrates or diffuse surfaces without requiring second-surface masking. Substrates as thin as 400µm can be tested with typical scan times of 300ms per measurement point.
Based on high precision spectroradiometric instrumentation, proprietary measurement techniques and expertise in low-light measurement technology developed by Gamma Scientific, the product range features industry-leading accuracy, repeatability and throughput, including both refractive index determination and thin film coating thickness.
Highly Accurate & Repeatable Reflection Measurements
- Nondestructively capture complete spectral and colorimetric properties with scan times as short as 200 msec per measurement point
- Isolated first-surface measurement of thin glass substrates down to 500 µm in thickness without requiring second-surface masking
- Measure total reflectance or isolate internal optical interfaces
- Test capability for diffuse or specular surfaces
- Programmable, multi-location measurement, pass/fail criteria settings and binning capabilities
- Configuration options including handheld, semi-automatic and fully automatic rotary systems with robotic loading
In addition to our exceptional technical and functional capabilities, Gamma Scientific is ISO/IEC 17025 accredited by NVLAP (NVLAP lab code 200823-0).
- Anti-reflectance coating characterization
- Flat-panel display glass testing
- Touchscreen display glass testing
- Optical filter / lens testing
- Pyrolytic glass coating test & characterization
- Characterization of flat panel displays, photovoltaic coatings, low-E architectural coatings, paint samples and diffuse plastics