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Hitachi - Model SU3500 -Scanning Electron Microscope
The SU3500 Scanning Electron Microscope features innovative electron optics and signal detection systems to provide unparalleled imaging and analytical performance. Designed with intuitive logic, the new user-friendly GUI provides comprehensive image observation and display functions. Engineered for a wide range of applications including biological specimens and advanced materials, the SU3500 is sure to be the workhorse microscope in any laboratory.
Fast Auto Imaging
"Best-in-class" Auto Start Functions (Focus, Brightness, Contrast, and Stigmation) for unmatched operational ease and efficiency.
Low kV and Low Vacuum Performance
The Hitachi "Hex-Bias" probe current optimization technology combined with the all new Ultra Variable-Pressure (UVD) detector offers superior imaging and surface information at low accelerating voltages and low vacuum conditions.
Innovative electron source and detectors give superior imaging and analytical performance. Hex bias technology delivers high brightness at low accelerating voltages and the ultra variable-pressure detector is optimized for imaging surface at low pressures. The SU3500 is sure to be the workhorse in any laboratory.
Unparalleled Image Quality
All new electron optics design with best-in-class image sharpness. 7 nm SE Image Resolution at 3 kV, 10 nm BSE Image resolution at 5 kV.
Intuitive Operation
Wide-screen GUI and fast auto image optimization functions (7 seconds) via "delegation" technology.
Ultra Variable-Pressure Detector
Image surface information at low vacuum and low accelerating voltages.
Stereoscopic Image Function
Point and click for seamless, real-time "3D" image observation.