- Home
- Companies
- Sentek Instrument LLC
- Products
- Sentek Instrument - Model NovaPT™-E - ...
Sentek Instrument - Model NovaPT™-E -Engine Pressure Sensors
Dynamic pressure measurement at ultra-high temperatures is highly desirable in many industrial processes. Limited maximum service temperatures of semiconductor transducers or piezoelectric devices force engineers to use either water cooling to the sensors or to employ standoff tubes to guide pressure to a point where these transducers can be used. Besides increased complexity and cost, the bulky size of the cooled sensors makes access to many locations difficult. In the meantime, the pressure guiding tubes damp the dynamic signals, which are the true signals for combustion diagnostics and gas turbine compressor stall/surge detection.
The NovaPT™-E dynamic pressure sensor is developed to overcome this technological bottleneck. This product is built with a monolithic single crystal sapphire structure and is packaged with an Inconel housing for reliable pressure measurement under ultrahigh temperatures. This unique sensor comes with a miniature interrogator and the optical fiber cable that connects the sensor to the interrogator permits long distance quality signal transmission and flexible sensor deployment.
- Model : NovaPT™-E1000
- Maximum Sensor Tip Temperature : 1000°C(1832°F)
- Background Pressure : Arbitrary up to 69bars (lOOOpsi)
- Diaphragm Resonance Frequency : 400kHz
- Frequency Response Pressure Resolution Combined Non-linearity, Hysteresis and Repeatability Sensor Tip Diameter : 20-4,000Hz
- 7mbar (O.lpsi) typical, 20mbar (0.3psi) max <1%F.S. 4.8mm
- Installation Threads : 5/16-24 UNF
- Fiber Cable Length : 0.5m 150°C rated fiber cable, 3,15 or 50m extension cable option available
- Dimensions : 26x108x180mm
- Sensor Channels : lor 2
- Power Supply : 24±4V
- Power Consumption : <3W
- Data Outputs : USB micro-B digital, SMA 0-5V analog output optional
- Environmental Conditions Software : -10 to 45°C, 5-90% humidity
- Flexible data display, spectrum analysis and storage control