- fast and long term stable results
- superior spectroscopic performance
- reflectance probes with internal reference
- large spot size (5mm diameter)
- best spectra quality with moving sample conditions
- GmP friendly hardware design
- GAMP compliant analyzer management software
- OPC connectivity
- interfaces to SiPAT (Siemens), SynTQ (Optimal ltd.) and PharmaMV (Perceptive Engineering Ltd.)
- Predictor interfaces: Simca, Unscrambler
Continuous Manufacturing
PAT-Applications in continuous pharmaceutical manufacturing processes
High Shear Wet Granulation
Introduction to the Application of NIR based PAT to monitor High Shear Wet Granulation
Tablet press feed frame
Potency & Blend/Granule Uniformity measurement with NIR probe in the feed frame of tablet presses
Fluid bed coating
Online NIR spectroscopy tablet and granule coating thickness measurement
Roller compaction
NIR can be used to measure ribbon density and porosity
Hot melt extrusion
NIR based inline monitoring for pharmaceutical hot melt extrusion
Sentronic solutions for process analysis comprise the SentroPAT FO platform, the probe and the corresponding analyzer management software. The result is a powerful, proven package that can be tailored to your specific process-monitoring needs.
SentroPAT FOSentroPAT FO is a compact analyzer for direct monitoring of production processes for solid-dose pharmaceuticals. It is an extremely versatile system that can be quickly and easily integrated into existing production equipment and processes. It offers extremely valuable insights into practically all process steps, such as blending, granulation, drying and compressing. It delivers precise data on input materials, process progress, product homogeneity, and the ideal process end-point. The combination of high-speed measurement and highly robust, innovative probe technology creates an exceptionally reliable tool for improved process understanding and measurement.
The NIR advantageNIR infrared spectroscopy is the most versatile PAT technology available, with a proven track record in laboratory applications. It can be deployed to capture both physical and chemical process parameters, often rendering additional particle measurement equipment unnecessary.
Fast diode array technologyThis specific NIR technology is ideal for analyzing fast-moving samples, without compromising accuracy. Measurements can be performed in milliseconds, allowing the prompt elimination of spectra with poor sample presentation.
Low maintenanceA key focus of design and development from the very outset was minimum maintenance effort and cost of ownership. The system continuously and automatically monitors all key instrument parameters, operating reliably for extended periods without user intervention. The only regular maintenance required is light source replacement, generally at intervals of one to two years. This simple task can be performed without special tools or skills.
Partnership with SentronicSentronic has implemented end-to-end, fully compliant documentation across the entire product life cycle for many customers, and for many projects. We are an experienced, flexible partner. We understand that each customer has specific needs and imperatives, and we develop made-to-measure answers to the challenges of each PAT project. We are happy to play a supporting role within your existing organizational structures, providing vital input. You can be sure of effective communications, and quick, easy access to expert advice.
