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Spectra - Model Ultra S/TEM -Scanning Transmission Electron Microscope
Scanning transmission electron microscope for imaging and spectroscopy of beam sensitive materials. To truly optimize S/TEM imaging, EDX and EELS may require acquisition of different signals at different accelerating voltages. The rules may vary from sample to sample but, it is generally accepted that: 1) the best imaging is done at the highest possible accelerating voltage above which visible damage will occur, 2) EDX, especially when mapping, benefits from lower voltages with increased ionization cross-sections, thus yielding better signal-to-noise ratio maps for a given total dose, and 3) EELS works best at high voltages to avoid multiple scattering, which degrades the EELS signal with increasing sample thickness.
Unfortunately, acquisition at different accelerating voltages on the same sample without losing the region of interest—all during a single microscopy session—is not possible. At least, until now.
Imagine a Thermo Scientific Spectra™ 300 S/TEM:
- That can truly be operated at different voltages (all the voltages between 30 and 300 kV for which alignments were purchased) in a single microscopy session
- Where changing from an accelerating voltage to any other one takes about 5 minutes
- That can accommodate a radically different EDX concept with a 4.45 srad solid angle (4.04 srad solid angle with an analytical double tilt holder)
With the new Spectra Ultra S/TEM, the accelerating voltage becomes an adjustable parameter, just like probe current, and the massive Ultra-X EDX system enables chemical characterization of materials too beam-sensitive for conventional EDX analysis.
Built on an ultra-stable foundationThe Spectra Ultra S/TEM is delivered on a platform designed to offer an unprecedented level of mechanical stability quality through passive and (optional) active vibration isolation.
Like the Thermo Scientific Spectra 200 S/TEM and Spectra 300 S/TEM, the system is housed in a fully redesigned enclosure with a built-in on-screen display for convenient specimen loading and removal. For the first time, full modularity and upgradeability can be offered between uncorrected and single-corrected configurations with variable heights, allowing maximum flexibility for different room configurations.
- Fastest time to optimized results from more materials
- Lowest dose STEM/EDX for the characterization of more materials
- Unprecedented sensitivity with the Panther STEM detection system
- Highest resolution STEM imaging performance
- High-energy resolution and high-brightness sources
- Advanced STEM imaging capabilities
- In situ capabilities of the Spectra Ultra S/TEM
Uncorrected
Energy spread: 0.2–0.3 eV
Information limit: <100 pm
STEM resolution: <136 pm
Probe corrected
Energy spread: 0.2–0.3 eV
Information limit: <100 pm
STEM resolution: <50 pm (125 pm @ 30 kV)
Probe+Image Corrected X-FEG/Mono
Energy spread: 0.2–0.3 eV
Information limit: <60 pm
STEM resolution: <50 pm at 300kV with >30pA of probe current
STEM resolution: <125 pm at 30kV with >20pA of probe current
Probe+Image Corrected X-FEG/UltiMono
Energy spread: 0.05 eV (0.025 eV @ 60kV)
Information limit: <60 pm
STEM resolution: <50 pm at 300kV >30pA of probe current
STEM resolution: <125pm at 30kV with >20pA of probe current
Probe+Image Corrected X-CFEG
Energy spread: 0.4 eV
Information limit: <70 pm
STEM resolution: <50 pm (<136 pm @ 30 kV) with >100pA of probe current
Source
X-FEG Mono: High-brightness Schottky field emitter gun and monochromator with a tunable energy resolution range between 1 eV and <0.2 eV
X-FEG UltiMono: High-brightness Schottky field emitter gun with ultra-stable monochromator and accelerating voltage with a tunable energy resolution range between 1eV and <0.05 eV (<0.025eV @ 60kV)
X-CFEG: Ultra-high brightness with an intrinsic energy resolution of <0.4 eV with 14nA of total beam current and <0.3eV with 2nA of total beam current
Flexible high-tension range from 30 – 300 kV
