Proto LXRD - Ultimate Audit Station for Residual Stress and Retained Austenite Measurement
Our laboratory and industrial testing residual stress XRD powerhouse, the LXRD system is designed for heavy-duty, around-the-clock operation. Extremely fast, accurate, and reliable, the LXRD offers the highest return on investment in the industry. Measurements can be performed in as little as a minute. The LXRD is available with standard or oversized enclosures for large part capacity. Flexible instrument options and available residual stress mapping make the LXRD a proven leader in high-powered residual stress and retained austenite measurement systems.
LXRD Standard
LXRD measuring a crankshaft
Our high-performing LXRD Standard small enclosure system, designed with compactness in mind, can fit through a single door. This system is perfect for measuring smaller parts and samples up to 30 cm.
This state-of-the-art instrument is available in a cost-effective bare enclosure configuration or upgraded with numerous options, including a manual XY-positioning stage, phi rotation stage (automated triaxial measurement), fully automated 300x200-mm-travel XY residual stress mapping stage, and % retained austenite measurement capabilities. The radiation-proof enclosure, automated 400 mm z-axis, MG2000 1200 W high-power goniometer, fully integrated chiller, and levelling pads with wheels provide performance and flexibility in a compact package.
LXRD Widebody
The LXRD Widebody has all the features of the standard model but comes with an increased enclosure capacity for measuring parts up to 50 cm. With a 500-mm Z axis and an increased travel of 300 mm for the Y stage, the Widebody provides one of the largest measurement envelopes of a stand-alone cabinet system.
LXRD Modular Mapping
The LXRD Modular Mapping system introduces high-powered residual stress mapping to large components. Oversized parts composed of materials that are difficult to measure, such as titanium, are no longer restricted to low-power portable systems. With over 2 meters of measurement space, heavy-duty XY-mapping stages, and a removable mapping stage, the Modular Mapping system has the flexibility to meet all of your complex experimental needs.
LXRD Gantry
The LXRD Gantry system is Proto’s largest enclosure system. With a 3.5-meter walk-in enclosure and long-travel overhead XYZ slides, the LXRD Gantry simplifies measurement of large, heavy components by moving the goniometer instead of the sample. Outfitted with a GR2000 goniometer, this instrument provides the flexibility of built-in phi rotation for triaxial measurements.
LXRD Dual-Axis
The LXRD Dual-Axis is Proto’s full-featured research-grade instrument for residual stress measurement. A secondary chi rotation stage enables measurement in true side inclination (in addition to omega and modified side inclination). The XY-mapping stage, phi rotation stage, video microscope, and x-ray beam aperture sizes (as low as 30 microns) provide advanced tools for your microarea residual stress measurement needs.