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WITec AlphaModel 300 RAS -Atomic Force Microscope

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The unprecedented all-in-one alpha300 RAS combines Raman, AFM, and SNOM imaging in a single instrument for the utmost flexibility and sophisticated sample characterization. By combining the imaging techniques, simultaneous Raman-AFM analysis, TERS, and Nearfield-Raman (Raman-SNOM) imaging can be easily performed.

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  • All features of the alpha300 R (Raman), the alpha300 A (AFM), and the alpha300 S (SNOM) microscope provided in one instrument
  • Excellent combination of high-resolution surface imaging (SNOM), comprehensive surface characterization (AFM), and chemical imaging (Raman)
  • Ideally suited for combined techniques such as Nearfield-Raman imaging and simultaneous Raman-AFM measurements
  • Convenient switching between the measurement techniques is realized by a rotation of the objective turret
  • No sample movement between the measurements
Raman Operation Modes:
  • Raman spectral imaging: acquisition of a complete Raman spectra at every image pixel
  • Planar (x-y-direction) and depth scans (z-direction)
  • Image stacks: 3D confocal Raman Imaging
  • Time series
  • Single point Raman spectrum acquisition
  • Single-point depth profiling
  • Ultrafast Raman Imaging (1300 spectra per second) optional available
  • Confocal fluorescence microscopy
  • Bright Field Microscopy
  • Dark Field, Phase Contrast and DIC optional
  • Upgradable for epi-fluorescence applications
AFM Operation Modes:
  • Contact Mode
  • AC Mode (Tapping Mode)
  • Digital Pulsed Force Mode (DPFM)
  • Lift Mode™
  • Magnetic Force Microscopy (MFM)
  • Electric Force Microscopy (EFM)
  • Phase Imaging
  • Force Distance Curves
  • Nano-Manipulation/Lithography
  • Lateral Force Microscopy (LFM)
  • Chemical Force Microscopy (CFM)
  • Current Sensing Mode
  • others optional
SNOM Operation Modes:
  • Scanning Near-field Optical Microscopy (SNOM) modes: bottom up and top down mode, collection mode
  • Confocal Microscopy (CM) modes:
    • Transmission
    • Reflection
    • Fluorescence (optional)
    • SNOM-AFM combinations: AFM operation modes of alpha300 A included or optional available
    • Acquisition of force-distance curves and light-distance curves
    • Fixed-bottom illumination
    • Total internal reflection illumination (optional)
Microscope Features:
  • Research grade optical microscope with 6 x objective turret
  • Video system: eyepiece color video camera
  • LED white-light source for Köhler illumination of tip and sample
  • High sensitivity b/w video camera to view sample and SNOM/AFM tip in transmission
  • Manual sample positioning in x- and y-direction, 25 mm travel
  • Microscope base with active vibration isolation system
  • Piezo-driven scan stage (scan range 100 x 100 x 20 µm; others optional)
Sample Size:
  • Usually 120 mm in x- and y-direction, 25 mm in height (adapter for larger heights available)
Computer Interface:
  • WITec software for instrument and measurement control, data evaluation and processing

Every alpha300 RAS can be upgraded to the + Version alpha300 RAS+ for automated measurements. It includes:

  •  Automated motorized sample positioner in x-, y-, and z-direction, 25 mm travel range (50 mm travel range optional)
  • Automated confocal Raman imaging (25 x 25 mm²; optional 50 x 50 mm²)
  • Automated multi-area and multi-point measurements
  • 2D and 3D Raman mapping
  • Raman depth profiling
  • Autofocus