Analytical Capabilities Services
Soleras’ in-house analytical and materials characterization capabilities include the following: ICP-OES (inductively coupled plasma optical emission spectrometry) to detect trace metals. Gas analysis for emission and process monitoring. SEM (scanning electron microscopy) with EDS (energy dispersive spectroscopy) for analysis of materials and surfaces. Metallography to determine physical structure and components of metals. Particle-size analysis. Density, hardness, surface and cross-sectional measurement. Phased array ultrasonic inspection. Magnetic flux mapping. CMM (coordinate measurement machine). Vacuum helium leak detection. XRF (x-ray fluorescence).