RJ Lee Group, Inc.
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Computer-Controlled Scanning Electron Microscopy (CCSEM)

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CCSEM combines a scanning electron microscope (SEM), x-ray analyzer (EDS) and digital scan generator controlled by intelligent software. Using this technique, large numbers of individual particles can be located, sized and characterized quickly, i.e., seconds per particle. These particles can then be grouped into particle type (species) classes based on their elemental composition and shape.