Iontof Gmbh
M6 TOF Analyser
FromIontof Gmbh
Transmission, mass resolution and mass accuracy are the most essential figures of merit for a time-of-flight mass analyser. The M6 reflectron mass analyser features high transmission and high mass resolution. Both are achieved simultaneously and without compromise in positive and negative SIMS. This new level of performance allows mass interferences of e.g. CH/13C, CH2/N containing molecules to be resolved even in the higher mass range, thus facilitating molecular peak identification. Furthermore, the achievable mass accuracy is an important prerequisite for clear peak identification. The M6 mass analyser has a linear mass scale and provides superior mass accuracy of less than 10 ppm.
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time-of-flight mass analyzer
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optical detection
nanoprobe
The revolutionary new design of the extraction optics and detection system also provides up to three times higher transmission. In combination with high repetition rates and the improved primary ion currents of the Nanoprobe 50, three times lower detection limits can be achieved in dual beam depth profiling.
The new developments also allow for up to three times faster imaging. Formerly time consuming image acquisitions take only a few minutes today.
With the patented extended dynamic range (EDR) analyser technology, seven orders of magnitude of dynamic range can be achieved. Intensities of more than 100 ions per pulse per mass with an excellent linearity and reproducibility can be recorded.
In conventional TOF-SIMS instruments the mass resolution depends on the pulse width of the primary ion source and hence the resulting acquisition time and image resolution. The delayed extraction mode of the M6 overcomes this restriction and combines maximum image resolution with high spectrometry performance in a unique way.
This allows for mass resolutions above 10,000 in combination with lateral resolutions below 50 nm. Previously this mass resolution was only achievable in a dedicated spectrometry mode with limited lateral resolution.
The delayed extraction mode also provides excellent performance on very rough samples and, in combination with the excellent depth-of-field of the M6 extraction optics, significantly reduces any topographic contrast.
The delayed extraction mode also provides excellent performance on very rough samples and, in combination with the excellent depth-of-field of the M6 extraction optics, significantly reduces any topographic contrast.
Analysis of the fibre structure of a commercial adhesive bandage showing the surface distribution of C4H9 (red), Na (green) and Al (blue). The image nicely demonstrates the excellent depth-of-field of the M6 TOF analyser.
The height difference from the top of the fibres to the aluminium substrate is more than 300 µm. Nevertheless, the corresponding spectrum shows a good mass resolution with clear separation for inorganic and organic peaks.