STARDiFY
Most popular related searches
Wafer Map?
- Provides fast data processing and stable services based on core technologies for spatial data processing
- Provides a solution that can be used for various purposes, such as providing speed and performance that can be used on the web while storing hundreds of millions of geometries
- WaferMap is continuously upgraded to meet the diverse needs of customers, and supports users to easily manage and use data through a web-based user-friendly interface
WAFERMAP
It provides a function to compare and analyze various test results at the wafer / chip / cell level in the Fab process.
WAFERMAP
A spatial information solution that can increase the efficiency of business by performing various spatial information data anagement functions in addition to spatial information creation and visualization functions based on Microsoft Excel.
WAFERMAP
- Cell-basedStore and manage massive amounts of information
- WaferEasy to search and add, delete, modify information
- WaferFree to zoom in and out and easy to measure cells
- WaferFail can be overlapped and classified
- WaferWafer, Chip, Cell layer can be overlapped selectively
Spatial WaferMap Main Features
- Dynamic display of various semiconductor design specificationsDynamic WaferMap creation based on input specifications
- Defect detection location coordinate-based displayDetermine whether it exists inside or outside of Chip or Bank
- Comprehensive analysis of errorsOverlap analysis of test results for each process such as TDBI, EPM, HOT & COLD Test
- Cell-based Fail DisplayCell-based test and analysis possible
Spatial WaferMap
Development support tool for visualizing Web-based WaferMap
Patent applicationSpatial WaferMap is a patent application for `A method for generating a spatial wafer map based on GIS, and a method for providing wafer test results using the same`.
Web versionIt implements the Web version by generalizing the WaferMap visualization technology and experience based on stand-alone that was applied to H company for quality analysis.