EDX9000A Vacuum Desktop Type Alloy Testing Spectrometer - Metal
Elemental analysis accuracy often holds crucial significance, particularly when evaluating the composition and grade of alloys. In certain other applications, however, speed takes precedence: testing centers that handle a large number of samples require aOver the years, INTEXS ESI has consistently delivered highly reliable and top-quality performance with its XRF alloy analyzers in the field of alloy analysis. These analyzers have become the de facto standard in numerous analytical laboratories worldwide. The latest generation of the EDX9000A alloy analyzer now boasts a sensitivity that is twice as high as its predecessor. Its precision is approaching that of traditional laboratory chemical analysis methods, while its speed and user-friendliness far surpass those of the latter. It has been comprehensively optimized for various alloy analyzer applications.
The vacuum-type EDX9000A alloy analysis spectrometer incorporates the latest advancements in ED-XRF detector technology and utilizes high-count-rate and high-resolution SDD detectors. These intelligent innovations position it as one of the most advanced intermediate laboratory XRF desktop analyzers in the realm of alloy composition testing. As a result, customers have the option to either significantly enhance the precision of their analysis, even for small or trace amounts of element content, or greatly accelerate the testing speed to meet the demands of high sample throughput.
Simultaneously, the EDX9000A alloy analyzer features an excellent integration of the powerful Fundamental Parameters (FP) method and the Empirical Coefficient (EC) method. This enables it to conduct analyses not only on high-purity alloys but also on samples with complex matrices and multiple impurities, providing both qualitative and quantitative results. The application of the FP parameter algorithm also substantially reduces the instrument's reliance on standard samples.
The EDX9000A offers several convenient functions:
One-click instrument initialization with automatic matrix matching.
Automatic qualitative, semi-quantitative, and quantitative analysis. Real-time comparison of test spectra of different samples is possible.
Spectral processing and correction, including the removal of double peak and escape peak interferences, and reduction of the element absorption enhancement effect.
Spectral background deduction, effectively improving the detection accuracy of trace elements.
Real-time refreshing of measurement results.
A simple process bar wizard that assists users in creating new custom calibration curves.
Generation of customizable test reports and one-click printing.