BrighTex Bio-Photonics, LLC products

First system in the world to do wafer 3D & 2D analysis simultaneously. Increase your yield with the most advanced A.I. in semiconductor metrology. BTBP`s system detects and quantifies process defects. Wafer metrology is the key to process control and yield enhancement.

We are bringing our cutting edge measurement technology from the semiconductor industry over to the skin industry. Our systems are able to achieve few microns resolution in the x, y space and sub micron resolution on the z-axis. With this information our AI can generate a 3D model with accurate measurements so you can find the curvature of someone`s face and the depth of a pore with just our system (18 Million Polygons). With this high resolution, the uncanny valley is a thing of the past.