CSInstruments products

The Nano-Observer AFM microscope is a flexible and powerful AFM. Designed with the ultimate technologies, it combines performance and ease of use. The USB controller offers a real integrated lock-in for better measurement capability (phase detection, Piezo-Response Mode…). A low-noise laser and a pre-alignment system provide simplicity and high resolution on a compact AFM head. Its intuitive software simplifies all Atomic Force Microscope settings to allow quick and safe AFM acquisitions.

Kelvin Force Microscopy (KFM) allows to measure the surface potential between an oscillating conductive tip and the surface. Surface potential measurement can be used to determine intrinsic properties like work function or bandgap. CSInstruments has developed an ultra-sensitive implementation of KFM named as High Definition-KFM (HD-KFM), which uses 2 lock-ins matched to the first two eigenmode frequencies of the cantilever to acquire both topography and surface potential. This setup combines the benefits of the single-pass approach with the enhancement of the electrical signal due to the mechanical resonance matching.

ACCESS-C probes are sharp silicon probes that allow a direct optical view of the AFM tip and designed for applications that require seeing the tip as it engages the surface.

ACCESS-FM probes are sharp silicon probes that allow a direct optical view of the AFM tip and designed for applications that require seeing the tip as it engages the surface.

The tip side of these probes is coated with polycrystalline diamond. The diamond lm is in-situ doped with boron to make it highly conducting. 1.6 spring constant is compatible for ResiScope, conductive, PFM modes.

The tip side of these probes is coated with polycrystalline diamond. The diamond lm is in-situ doped with boron to make it highly conducting. 1.6 spring constant is compatible for ResiScope & Soft ResiScope, conductive, PFM, KFM and EFM modes.

Highly conductive diamond probes, formed by a unique patented process ensure the best possible wear and electrical performance. These tips are sharper and last longer than any other electrical AFM probe.

Resiscope mode is a mode of contact AFM. A conductive tip saves changes in current and resistance on a wide range with an external amplifier. Curves of current / voltage can be conducted at various locations on the sample. Resistance and conductivity over to 10 decades

Concept Scientific Instruments has developed an alternative measurement mode called Soft Intermittent Contact mode (or Soft IC)  that combines the advantages of contact mode and force spectroscopy but prevententing  from their inconvenients like friction forces or intrinsic slowness.

The Nano-Observer AFM is compatible with a controlled environment during the image aquisition. With the Atmosphere control accessory, it is possible to isolate the volume inside the AFM, introduce an inert gas or control the relative humidity. Setting the relative humidity to values close to 0% inside the chamber is vital to have reproducible results when using electrical modes such as HD-KFM, ResiScope, SMIM, EFM,.. in order to avoid effects of local oxidation due to the presence of water layers on the surface. In the case of experiments of local-probe anodic oxidation, it is required to have a precise and reproducible control of the relative humidity (RH) during the study of oxidation kinetics. The small volume of the atmosphere control accessory, together with the diffusors in the gas inlet of the Nano-Observer AFM, allow a fast and rapid control of the changes in RH.