CSInstruments products

ACCESS-C probes are sharp silicon probes that allow a direct optical view of the AFM tip and designed for applications that require seeing the tip as it engages the surface.

ACCESS-FM probes are sharp silicon probes that allow a direct optical view of the AFM tip and designed for applications that require seeing the tip as it engages the surface.

The tip side of these probes is coated with polycrystalline diamond. The diamond lm is in-situ doped with boron to make it highly conducting. 1.6 spring constant is compatible for ResiScope, conductive, PFM modes.

The tip side of these probes is coated with polycrystalline diamond. The diamond lm is in-situ doped with boron to make it highly conducting. 1.6 spring constant is compatible for ResiScope & Soft ResiScope, conductive, PFM, KFM and EFM modes.

Highly conductive diamond probes, formed by a unique patented process ensure the best possible wear and electrical performance. These tips are sharper and last longer than any other electrical AFM probe.