Our non-contact 3D measurement systems are widely used in microelectronics and other precision industries for a vast array of applications, including flatness measurement, coplanarity measurement, roughness measurement, thickness & thickfilm measurement, measurement of transparent films and coatings, TTV measurement and much more.
Our solutions are trusted by major international companies, as well as many small and medium sized companies in R&D and production. With a worldwide network of qualified distributors and representatives, cyberTECHNOLOGIES is a strong global player our customers can count on.

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Model CT 100 - Compact and Flexible Non-contact Profilometer - Brochure