FormFactor, Inc. products

Customize your 150 mm probe station based on flexible modules at an incredible price! FormFactor introduces a new modular concept for its best-in-class 150 mm probe stations. This will make it even easier to configure your individual probe solution for current and future needs at an incredible price. Simply choose a base station and add as many application-specific starter kits as you need.

Perform high-performance, on-wafer S-parameter measurements at an affordable price with a probe station that is easy to purchase and fits into the smallest lab! FormFactor introduces the Genius Education Kits for RF and Microwave S-Parameter measurements – an entry level 150 mm probe solution for universities and schools, completely validated and proven to deliver leading-edge performance measurements. Our Genius Education Kits include all the critical components to make the measurements you want: Not only the probe station, probes, probe positioners, cables, calibration substrate and WinCal XE calibration software but also a Keysight Streamline Vector Network Analyzer – an industry first. And to optimize your measurements, the Genius Education Kits are designed for ease of use. All controls are easily accessible and allow precise and ergonomic operation.

Introducing the InfinityXT probe series. InfinityXT enhances and extends FormFactor’s industry-leading Infinity probe family, which has set the benchmark for accuracy and repeatability in the device characterization and modeling community for more than a decade. The new InfinityXT series advances the industry standard with higher temperature range, better tip visibility and durability, and support for narrower pitches as the market evolves. Recently, the industry has experienced explosive growth in the RF and microwave devices, driven by the automotive, mobile communications/5G and IoT device markets. The development of the new InfinityXT probe has been guided by the requirements of these high-growth markets. The requirements include ultra-wide bandwidth and wide temperature ranges for device modeling and characterization. 

Ideal for device characterization and modeling, Infinity probe combines extremely low contact resistance on aluminum pads with unsurpassed RF measurement accuracy for highly reliable, repeatable measurements. Proprietary thin-film and coaxial probe technology reduces unwanted couplings to nearby devices and transmission modes.

The industry-leading performance of the HFTAP K32 product joins FormFactor’s series of High Frequency Test probe cards, including the K10, K16 and K22 used for testing 1.0 GHz, 1.6 GHz, and 2.2 GHz DRAM devices. Advanced PCB technology, exclusively available from FormFactor, allows the fastest communication between the Device Under Test (DUT) and Automated Test Equipment (ATE). By utilizing FormFactor’s Matrix architecture, HFTAP K32 probe cards can test at speeds that no other full wafer contactor can achieve. The extended capability of FormFactor’s HFTAP K32 probe card architecture enables DRAM customers on wafer-level speed testing up to 3.2?GHz/ 6.4?Gbps for next generation known-good-die (KGD) memory. The recent industry-wide adoption of heterogeneous integrated systems enabled by 2.5D and 3D advanced packaging technology is driving the demand for KGD. 

The FRT MicroProf^® AP is a fully automated wafer metrology tool for a wide range of applications at different 3D packaging process steps, e.g. for the measurement of photoresist (PR) coatings and structuring, through silicon vias (TSVs) or trenches after etching, μ-bumps and Cu pillars, as well as for the measurement in thinning, bonding and stacking processes. With its modular multi-sensor concept, the flexible MicroProf AP measuring tool is ideally suited to perform a variety of measuring tasks in advanced packaging.