Iontof Gmbh products

Features and technical details: The M6 is the latest generation of high-end TOF-SIMS instruments developed by IONTOF. Its design guarantees superior performance in all fields of SIMS applications. New ground-breaking ion beam and mass analyser technologies make the M6 the benchmark in SIMS instrumentation and the ideal tool for industrial and academic research. High lateral resolution (< 50 nm) with the new Nanoprobe 50. Mass resolution > 30,000. Unique delayed extraction mode for high transmission with high lateral and high mass resolution simultaneously. Unmatched dynamic range and detection limits. TOF MS/MS with CID fragmentation for molecular structure elucidation. New flexible, push-button, closed-loop sample heating and cooling system for long-term operation without user interaction. Sophisticated SurfaceLab 7 software including fully integrated Multivariate Statistical Analysis (MVSA) software package

Information concerning chemical composition, physical properties and the three-dimensional structure of materials and devices at the nanometre scale is of major importance for new developments in nanoscience and nanotechnology. In a 3D SIMS measurement the initial topography of the sample surface as well as topographic changes during the experiment cannot be easily identified Scanning Probe Microscopy (SPM) provides complementary information about the surface topography and can also be used to measure the physical properties of the analysed sample. Through the combination of these two techniques true in situ three-dimensional chemical imaging becomes possible. The new M6 Plus platform combines the high-end performance of the M6 with the possibility to perform in situ SPM measurements. The large area SPM unit has a scan range of up to 80 x 80 x 10 µm³ and is ideally suited to provide topographic information for true 3D SIMS measurements.

With the Q Exactive^TM extension for the M6, IONTOF provides the first commercial SIMS instrument which combines the highest mass resolution (> 240,000) and highest mass accuracy (< 1 ppm) with high resolution cluster SIMS imaging. The combination of the fast imaging capabilities of the TOF analyser with the unique performance of the Q Exactive^TM for unambiguous peak identification provides a new level of SIMS information from organic samples. The new instrument extension also provides field proven, high-end MS/MS capabilities and sets a new benchmark for high resolution molecular SIMS applications. The powerful combination of the gas cluster ion source and the Orbitrap^TM analyser enables the distinction of different features even in highly complex organic samples. For all spectra shown in the two examples the same level of mass resolution and mass accuracy is obtained. Both are a prerequisite for unambiguous peak identification.