Model M6 -SIMS Technology One Step Ahead

Features and technical details: The M6 is the latest generation of high-end TOF-SIMS instruments developed by IONTOF. Its design guarantees superior performance in all fields of SIMS applications. New ground-breaking ion beam and mass analyser technologies make the M6 the benchmark in SIMS instrumentation and the ideal tool for industrial and academic research. High lateral resolution (< 50 nm) with the new Nanoprobe 50. Mass resolution > 30,000. Unique delayed extraction mode for high transmission with high lateral and high mass resolution simultaneously. Unmatched dynamic range and detection limits. TOF MS/MS with CID fragmentation for molecular structure elucidation. New flexible, push-button, closed-loop sample heating and cooling system for long-term operation without user interaction. Sophisticated SurfaceLab 7 software including fully integrated Multivariate Statistical Analysis (MVSA) software package