Kratos Analytical Ltd. products
Kratos - Automated Multi-Technique Imaging X-Ray Photoelectron Spectrometer
The latest generation spectrometer, the AXIS Supra+, combines market-leading spectroscopic and imaging capabilities with unrivalled automation to ensure high sample throughput and ease of use.
Kratos - Gas Cluster Ion Source (GCIS)
This multi-mode gas cluster ion source is designed to operate in both Arn+ cluster and Ar+ monatomic modes making it suitable for sputter cleaning and depth profiling organic, inorganic and metallic thin films. In addition it may also be used to generate low energy He+ ions for use with ion scattering spectroscopy (ISS).
Kratos - Monatomic Ar+ Ion Source
This ion source is designed to produce a stable, high current, monatomic Ar+ ion beam with energies from 0.5 to 4 keV. High ion flux guarantees excellent sputter depth profiling etch rates. The Minibeam 4 is ideally suited to sputter cleaning and depth profiling inorganic and metallic films. It may also be used to generate low-energy He+ ions for use with ion scattering spectroscopy (ISS).