Proto Mfg. products
Standard Systems And Custom Solutions - XRD Residual Stress
Proto LXRD - Ultimate Audit Station for Residual Stress and Retained Austenite Measurement
Our laboratory and industrial testing residual stress XRD powerhouse, the LXRD system is designed for heavy-duty, around-the-clock operation. Extremely fast, accurate, and reliable, the LXRD offers the highest return on investment in the industry. Measurements can be performed in as little as a minute. The LXRD is available with standard or oversized enclosures for large part capacity. Flexible instrument options and available residual stress mapping make the LXRD a proven leader in high-powered residual stress and retained austenite measurement systems.
Standard Systems And Custom Solutions - Powder Diffraction
Proto AXRD - Benchtop Diffractometer
The AXRD Benchtop is powerful enough to enable advanced techniques formerly only possible with full-sized laboratory units. This unit is unmatched in versatility, boasting a superior range of capabilities in a form factor that fits in any lab. Because of its decoupled motors, the system is not limited to a fixed theta-2theta or theta-theta geometry; instead, it can be used for a wide range of experiments, including rocking curves, glancing-incidence diffraction (GID), and theta oscillation during Bragg-Brentano scanning. In fact, Proto’s Benchtop is the only benchtop diffractometer with an available parallel beam optic and long Soller slit for proper GID measurements.
Standard Systems And Custom Solutions - High-Resolution XRD
Proto AXRD - Model LPD-HR - Superior High-Resolution X-ray Diffractometers
The AXRD LPD-HR is our popular LPD system with upgraded optics to enable the characterization of thin films and single-crystal materials. Characterize the physical surface properties of your thin films, multilayer coatings, and interfaces with XRR. Analyze epitaxial layers and determine the crystalline perfection of bulk single crystals with high-resolution rocking curves. Gain valuable information about epitaxial layers and efficiently analyze strained films with reciprocal space mapping. Carrying over the LPD’s innovative goniometer design along with the latest advancements in motor and encoder technology, this system provides the utmost accuracy for your experiments.
Standard Systems And Custom Solutions - Laue Single Crystal
Proto - Model Laue-COS - Single-Crystal Orientation System
Utilizing modern, cutting-edge technology, Proto developed the Laue-COS system to offer a convenient solution for orienting single-crystal materials such as scintillation crystals, non-linear optics, piezoelectrics, minerals, and substrates. Producing research-quality data with impressive speed, this turn-key system features the latest in digital technology and an assortment of advanced feature options to ensure easy and efficient collection. The Laue-COS is a self-contained instrument that does not use any consumables (e.g., detector gases), and it enables experiments on versatile samples, geometries, and crystal systems. From small crystals to heavy boules and rods, this Laue orientation system provides a unique solution for a wide range of applications.
