Proto AXRD - Model LPD-HR -Superior High-Resolution X-ray Diffractometers

The AXRD LPD-HR is our popular LPD system with upgraded optics to enable the characterization of thin films and single-crystal materials. Characterize the physical surface properties of your thin films, multilayer coatings, and interfaces with XRR. Analyze epitaxial layers and determine the crystalline perfection of bulk single crystals with high-resolution rocking curves. Gain valuable information about epitaxial layers and efficiently analyze strained films with reciprocal space mapping. Carrying over the LPD’s innovative goniometer design along with the latest advancements in motor and encoder technology, this system provides the utmost accuracy for your experiments.