Pulstec Industrial Co., Ltd. products

The µ-X360 is an non-destructive X-ray analyzer for measuring the residual stress in metallic surfaces. This small, light-weight, low-cost analyzer can measure the stress efficiently by detecting the full Debye ring data from a single incident X-ray angle.

The system is capable of writing nano-scale structures at high speed directly on to the surface of a resist coated substrate (examples of typical substrates include semiconductor wafers or glass). The substrates are rotated in normal air condition. Compared to conventional lithography systems the NEO-500 has advantages of compact size and low investment costs without comprising performance. These advantages are achieved by using a visible semiconductor laser as a light source and Pulstec`s uniquely designed optics.

This scanner obtains 3D data without contact based on the optical application technology.

This light weight and precise non-contact 3D scanner can be implemented to multi-jointed digitizer.

This system is check and adjustment system for lens unit by using Shack-Hartmann method.

Introducing the 2 new `Blu-ray Stamper Evaluation Systems` now added to the successful MASTER electrical signal tester series. This new test equipment is designed specifically for Stamper evaluation; featuring reliable performance, compact size, and the same software designed for the BD MASTER. Standardizing key optical components in our entire MASTER series means testers give excellent correlation between systems. The option to swap between stamper and replica testing is quick and easy.