SE Technologies Corp. products
Optical Microscopes & Video Systems
Optical and Video Systems and accessories, A-Zoom Microscope, Confocal Microscope.High-Speed Singal Generation and Test & Measurement Equipment
TDR Instrument: Provides differential and common mode 9ps TDR and 7ps TDT incident pulses, Enables increased resolution for TDR analysis of high-speed interconnects and circuits, Improve TDR risetime. Pulse Generator: Rise times as low as 5ps for time domain, Step pulse, impulse waveform output application, Coaxial Components: Bias Tees and DC Blocks provide excellent frequency and time domain response, Attenuators - Provide frequency response up to 60GHz, Low Pass Filters - Provide standard and custom absorptive filters, Power Dividers and Pick-Off Tees - Provide broadband device to combine and split signals up to 40GHz.RF/Microwave
Wafer & Substrate Probe Stations & Accessories
DC to 330 GHz, Stable probe station can reduce expendables used and prevent wafer scraped, Independent cal and wafer chuck Z & θ, Five levels configurations to choose from Manual, Motorized, Joystick programmable, Software programmable and, Semi-Automatic, Can upgrade when you need, and just upgrade in your LAB, High performance thermal chuck system. The fastest transition times in the industry, Coolant temperature never exceeds 20 ºC. Temperature ranges as high as 600 ºC.
Auriga Measurement System
Precision Load Pull (PLP) Measurement System, Load Pull Legacy Hardware and Software Upgrade Package, Precision Noise Parameters (PNP) Measurement System, NP5 Software Upgrade Package, Pulsed IV (PIV) Measurement System - the highest current and voltage system available, Component Test System (CTS) - Integrated Module and MMIC Test Solution, High Current Bias Tees, Characterization, Modeling and Design services: Small signal 0-50GHz, Large signal 0-110GHz, Load pull, single and multi-tone signal drive, Noise.
Smart Tuner - Tuner based Load and Source Pull Measurement System
A new state-of-art automatic tuner for the Wireless Industry, Fast tuning speed, high matching range and high power capability, Sealed and rugged design, ideal for testing environments, Small footprint and ease installation, a real benefit on any crowded bench, a probe station and the ever changing equipment sharing problem, Advanced, user-friendly software.
Wireless Communication System Test Equipment
Carrier to Noise Generator - Precision BER versus C/N Testing using AWGN, White Gaussian Noise Generator, Satellite to Ground Station RF Link Emulator, Frequency Synthesizer - HF to 30GHz, Low Noise, 1 Hz Resolution, Multi-channel Broad Band Solid State Attenuator, Frequency Converters, RF Interfaces.
Automatic, Accelerated, Reliability Test System
DC-18GHz, 60W RF device lifetest, includes stress and measurement: Stress temperature range: 50 °C to > 250 °C, stability of +/- 2 °C, Advanced multi-dimensional dynamic lifttest algorithm, 32 RF Devices with individual DC Bias control, independent RF power level, and independent thermal control, Embedded third-party parametric analyzer, custom characterization and benchmarking, Simple user interface, collect and export data in raw or graphic. Idea for SiGe, GaAs, InP, GaN, SiC material RF device.
Manual and Automatic Test Fixtures and Calibration Standards
RF Test Fixtures: Packaged Devices, Chip, Substrate ( Microstrip & Coplanner ). Calibration Kits. Automated RF Device Handler. TDR and RF Probes.
LCD FPD
Photoelastic Modulator Based Precision Measurement System
Photoelastic Modulator (PEM). Low Level Birefringence Measurement System. Visible light to Deep UV. Quality control metrology. Low-level birefringence measurements of Plate glass, Scientific optical components, Laser crystals, DVDs. Qualification of semiconductor photolithography components including. Calcium fluoride windows for operation at 193nm and below. Fused silica optical components, Stepper reticles.
Parylene Deposition System / Benchtop Spin Coater
Bench Top Spin Coater. Programmable and Non-programmable. 8`, 12`, 15` bowls. Hot Plate. Temperatures from 50 °C to 150 °C. Parylene Coating System.